IEEE

Software Defect Prediction using Multi-Layer Perceptron based Support Vector Machine Classifier

Abstract: In recent days, Software Defect Prediction (SDP) systems are evolving gradually as they improve software reliability and quality by ascertaining the defects in software. However, the testers ...
IEEE

Data-Driven Multilayer Perceptron Strategy for Modeling Dielectric Dispersive Permittivity

Abstract: Accurate dielectric characterization is often limited by iterative and computationally intensive optimization procedures. This work presents a custom multilayer perceptron (MLP) model ...