Abstract: Map-aided localization using 3D lidar scan points is an essential and fundamental technology in the field of Intelligent Vehicles (IVs) research, which can estimate the position and ...

Abstract: Wafer map defect classification is a crucial task in semiconductor manufacturing, as early detection of defects improves yield and minimizes production waste. This study proposes an enhanced ...

If you’re still navigating Google Maps the old-school way without tapping into Gemini, you’re seriously missing out. One of the best updates Google has launched in years now turns casual drives into ...