The scalable fabrication of probe tips for near-field scanning optical microscopy creates new opportunities in imaging. The increasing use of nanostructures for photonic applications in sensing and ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy Request A Quote Download ...

This webinar will cover three widely used high-resolution microscopy techniques that deliver nanoscale insights: scanning electron microscopy (SEM), transmission electron microscopy (TEM), and ...

A scanning probe microscope comes in a wide variety of flavors, they all produce a set of data points containing the measurements at each location. Usually these data points form a regular 2D grid, ...

An international research team has succeeded in controlling the chirality of individual molecules through structural isomerization. The team also succeeded in synthesizing highly reactive diradicals ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

Left: This is a simulated atomic force microscopy image. In this method, the tip of the microscope scans the surface of the sample (here: a single cobalt phthalocyanine (CoPC) molecule), measuring the ...

Introduction to SNOM: The Scanning Near-field Optical Microscope (SNOM) stands as a pivotal analytical tool in nanotechnology, enabling the visualization of nanostructures with resolution beyond the ...

1. An international research team led by NIMS, the Osaka University Graduate School of Science and the Kanazawa University Nano Life Science Institute (WPI-NanoLSI) has succeeded for the first time in ...

This is not an artist’s rendering, nor a physics simulation. This device held together with hardware-store MDF and eyebolts and connected to a breadboard, is taking pictures of actual atomic ...

A technical paper titled “High-speed mapping of surface charge dynamics using sparse scanning Kelvin probe force microscopy” was published by researchers at Oak Ridge National Laboratory, (ORNL), ...